BIWIN’s DMMC solution adopts a highly integrated design by adding a low-power controller to the NAND flash, and the Error Correction Circuitry (ECC) hardware engine achieves smart management of NAND flash and improves the durability of TLC and MLC NAND Flash, and the enhanced instruction support with embedded test mode gives high flexibility of customization management and fault analysis. With high reliability and stability, as well as multiple power-saving optimizations, BIWIN DMMC is well suited to the needs of a wide variety of mobile / portable devices, such as smartphones, tablets, and other emerging embedded applications.